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User name mhuang
Log entry time 00:59:04 on March 09, 2012
Entry number 364870
keyword=Sieve patterns as vertical beam position change#2930 (0,4mm) y is vertical up direction. #2928 (0,0) #2937 (0.-4mm) Since target field is bending beam electrons down, we see a decrease of acceptance when beam position moving down.
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