Sample events

• top left: lpr1e vs. lpr2e, cut in 1000<spec_l.gas.adc_sum_t<10000.
  - This is the definition of sample electron events from gas cerenkov detector, which will be used for pion rejector efficiency analysis. Dashed curve shows additional 2D cut in lpr1e and lpr2e to eliminate pion contamination in electron samples caused by gas cerenkov inefficiency.
• top right: lpr1e vs. lpr2e, cut in spec_l.gas.adc_sum_t>10000;
  - This defines sample pion events from gas cerenkov detector, which will be used for pion rejector efficiency analysis.
• middle left: lpr1e vs. lpr2e, no cut, lines show the cuts in lpr1e and lpr2e to select sample electron events, which will be used for gas cherenkov efficiency analysis;
• middle right: lpr1e vs. lpr2e, no cut, lines show the rectangular region in lpr1e and lpr2e to select sample pion events, which will be used for gas cherenkov efficiency analysis;
• bottom left: lpr1e vs. lpr2e, same as middle right, in larger scale;
• bottom right:lpr1e vs. lpr2e, same as bottom left, cut in spec_l.gas.adc_sum_t>10000.

Figure: sample events for a high pion run