In attendance: David Abbott, Fernando Barbosa, Jian-Ping Chen, Chris Cuevas, Ed Jastrzembski, Robert Michaels, Kent Paschke, Bodo Reitz, Xiaochao Zheng. - Xiaochao briefly described the physics of this experiment (what are we building this DAQ for?) and showed the idea of two possible solutions: FADC- and scaler-based fast counting DAQs. See http://hallaweb.jlab.org/experiment/E05-007/daq/minutes/daq_012505_zheng.pdf for slides. - Chris and David commented there exist some tagger/trigger systems in Hall B and currently being designed for Hall D that are similar to what we need here. - For comparison of the two options, Bob mentioned that FADC-based DAQ has virtually no deadtime while the scaler-based DAQ will have relatively high deadtime and will be difficult to measure. - Bob emphasized the FPGA part of the FADC-based DAQ should be re-programmable to experimentalists. David commented this is part of the "unknowns" of the FADC DAQ. Even if it is possible, there are only a couple of people on-site who know how to do so using the machine-level languages. - Bodo questioned whether there is a 3rd solution: take the analog sum of PMTs (from one detector) and send it to the FADCs. - Chris commented that he will have enough manpower to build the scaler-DAQ. However, the main disadvantage of scaler-based DAQ is the loss of information. Using FADCs one could study signal shape and pileups etc. using the full sampling at low frequnecies (large pre-scaling). - Jian-Ping commented that the electronics of Hall A are mostly down in the Hall, a major difficulty for building/testing the scaler-based DAQ. THe electronics of Hall C and SLAC are all upstairs in the control room. - Jian-Ping suggested that it is fairly easy to do test runs with both systems. For the scaler-DAQ we can borrow some commercial units from the electronic group, connect them to the detector outputs, and use a visual scaler to read out the counts. For the FADC-DAQ we can do similar tests. THere may even exist analog sum of the cherenkov, the shower/preshower that we can directly use. *** We did not reach the point where a decision can be made at this meeting. At the next meeting (Feb. 2nd, wednesday 2pm), Fernando will present what the DAQ/electronic group already have designed for different halls. Meanwhile, we (people from Hall A) will make plan for a test run. The best time for setting up the test run is during the major down time in Feburary.